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critical-regime-analysis

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An XAI framework that derives compact, interpretable analytical scaling relations for phonon-related material properties — enabling targeted materials screening with DFT-level validation.

  • Updated Jul 20, 2026
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An XAI framework that derives compact, interpretable analytical scaling relations for phonon-related material properties — enabling targeted materials screening with DFT-level validation.

  • Updated Oct 5, 2026
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