Author: Alyson Spitzig, Houchen Li, Talha Rehman
Licence: GNU General Public License v3
This package is meant to analyze the data acquired from non-contact Atomic Force Microscopy (nc-AFM). You could use this package to do Bayesian analysis about the parameters of your own nc-AFM measurements.
This package is mainly based on pymc3. We have several built-in models(Lennard-Jones, vdW force with different tip geometry, electrostatic forces etc.) for you to select to fitting!
Its details functions are including :
- the convertion between measured vibration frequency to force
- the force composition analyses(Lennard-Jones Force, electrostatic force and van-der-waals force etc.)
- the determination of z_axis offset
- and (might) also provide the analysis between different tip-sample geometry.
Please see documentation.py for further instructions.